Observation of small defects in silicon crystal by diffuse x‐ray scattering
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.325885
Reference10 articles.
1. Formation and nature of swirl defects in silicon
2. Characterization of swirl defects in floating-zone silicon crystals
3. The nature of swirls and its significance for understanding point defects in silicon
4. The formation of swirl defects in silicon by agglomeration of self-interstitials
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1. Microstructural and morphological properties of homoepitaxial (001)ZnTe layers investigated by x-ray diffuse scattering;Journal of Applied Physics;2005-04-15
2. Gamma-ray diffraction in the study of silicon;Materials Science and Engineering: B;1994-01
3. Triple crystal x‐ray diffraction analysis of chemical‐mechanical polished gallium arsenide;Journal of Applied Physics;1992-12
4. X-ray-diffraction measurements from imperfect GaAs crystals: Evidence for near-surface defects;Physical Review B;1990-09-15
5. X-ray scattering from point defect aggregates in single crystals;Progress in Crystal Growth and Characterization;1989-01
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