Method for the Study of Lattice Inhomogeneities Combining X‐Ray Microscopy and Diffraction Analysis
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1722382
Reference8 articles.
1. �ber eine r�ntgenographische Methode zur Untersuchung von Gitterst�rungen an Kristallen
2. A New X‐Ray Diffraction Method for Studying Imperfections of Crystal Structure in Polycrystalline Specimens
3. An X-ray study of the substructure of fine-grained aluminium
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