A New X‐Ray Diffraction Method for Studying Imperfections of Crystal Structure in Polycrystalline Specimens
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1700025
Reference2 articles.
1. Correction factors in the photographic measurements of x-ray intensities in crystal analysis
Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Novel Non-Destructive X-Ray Technique for Near-Real Time Defect Mapping;Nondestructive Characterization of Materials II;1987
2. High Resolution Digital X-Ray Rocking Curve Topography;Advances in X-Ray Analysis;1987
3. Digital X-Ray Rocking Curve Topography;MRS Proceedings;1986
4. X-Ray Microbeam Studies of Fracture Surfaces in Alumina;Journal of the American Ceramic Society;1965-01
5. Determination of the inherent reflecting range of a single crystal in diffractometry;Acta Crystallographica;1963-08-01
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