Novel X-ray diffraction microscopy technique for measuring textured grains of thin-films
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference17 articles.
1. Grain Nucleation and Growth During Phase Transformations
2. In Situ Measurement of Grain Rotation During Deformation of Polycrystals
3. Texture and microstructure imaging in six dimensions with high-energy synchrotron radiation
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5. Influence of nickel substrate grain structure on YBa2Cu3O7−x supercurrent connectivity in deformation-textured coated conductors
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1. Si_{1-x}Ge_{x} Single Crystals Grown by the Czochralski Method: Defects and Electrical Properties;Acta Physica Polonica A;2013-08
2. X-ray imaging of structural defects in Si1−x Ge x single crystals using a white synchrotron beam;Crystallography Reports;2011-09
3. Beyond the ensemble average: X-ray microdiffraction analysis of single SiGe islands;Physical Review B;2008-06-18
4. X-ray diffractometry and topography of lattice plane curvature in thermally deformed Si wafer;Journal of Synchrotron Radiation;2007-12-18
5. Composition inhomogeneity and structural defects in Czochralski grown Ge x Si1 − x solid solution crystals;Technical Physics Letters;2007-06
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