Distinct thin film growth characteristics determined through comparative dimension reduction techniques
Author:
Affiliation:
1. Department of Materials Science and Engineering, Case Western Reserve University, 10900 Euclid Avenue, White Building, Cleveland, Ohio 44106, USA
Funder
National Defense Science and Engineering Graduate
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
https://aip.scitation.org/doi/pdf/10.1063/5.0059655
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