Informatics and data science in materials microscopy-Reference-Cited by-同舟云学术

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Informatics and data science in materials microscopy

Published:2017-06 Issue:3 Volume:21 Page:141-158
ISSN:1359-0286
Container-title:Current Opinion in Solid State and Materials Science
language:en
Short-container-title:Current Opinion in Solid State and Materials Science

Author:

Voyles Paul M.

Funder

U.S. Department of Energy, Office of Basic Energy Sciences

University of Wisconsin Vilas Mid-Career Investigator Award

U. S. National Science Foundation

Publisher

Elsevier BV

Subject

General Materials Science

Reference130 articles.

1. Active pixel sensors for electron microscopy;Denes;Nucl. Instrum. Methods Phys. Res. Sect. A,2007

2. Cluster imaging with a direct detection CMOS pixel sensor in transmission electron microscopy;Battaglia;Nucl. Instrum. Methods Phys. Res. Sect. A,2009

3. A high-speed area detector for novel imaging techniques in a scanning transmission electron microscope;Caswell;Ultramicroscopy,2009

4. Facet development during platinum nanocube growth;Liao;Science,2014

5. Electron-beam induced transformations of layered tin dichalcogenides;Sutter;Nano Lett.,2016

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