Big-Data Reflection High Energy Electron Diffraction Analysis for Understanding Epitaxial Film Growth Processes-Reference-Cited by-同舟云学术

Big-Data Reflection High Energy Electron Diffraction Analysis for Understanding Epitaxial Film Growth Processes

Published:2014-10-06 Issue:10 Volume:8 Page:10899-10908
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Vasudevan Rama K.¹,Tselev Alexander¹,Baddorf Arthur P.¹,Kalinin Sergei V.¹

Affiliation:

1. Center for Nanophase Materials Sciences and ‡ORNL Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States

Funder

Basic Energy Sciences

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/nn504730n

Reference30 articles.

1. The structural analysis possibilities of reflection high energy electron diffraction

2. Reflection High-Energy Electron Diffraction

3. Dynamics of film growth of GaAs by MBE from Rheed observations

4. Current understanding and applications of the RHEED intensity oscillation technique

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