1. New Laser Beam Neating Methods Applicable to Fault Localization and Defect Detection in VLSI Devices
2. E. I. Cole, P. Tangyunyong, C. F. Hawkins, M. R. Bruce, V. J. Bruce, R. M. Ring, and W. L. Chong, in ASM International Symposium for Testing and Failure Analysis - 27th Annual, ASM International, Santa Clara, CA (2001), pp. 43–50.
3. M. R. Bruce, V. J. Bruce, D. H. Eppes, J. Wilcox, E. I. Cole, Jr., P. Tangyunyong, C. F. Hawkins, in ASM International Symposium for Testing and Failure Analysis - 28th Annual, ASM International, Phoenix, AZ (2002), p. 21.
4. E. I. Cole, J. M. Soden, J. L. Rife, D. L. Barton, and C. L. Henderson, in IEEE International Reliability Physics Proceedings - 32nd Annual, ASM International, San Jose, CA (1994), pp. 388–398.
5. J. Rowlette and T. Eiles, in ITC International Test Conference, IEEE, Charlotte, NC (2003), Vol. 1, pp. 264–273.