Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light
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Published:2016-05
Issue:
Volume:60
Page:62-66
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ISSN:0026-2714
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Container-title:Microelectronics Reliability
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language:en
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Short-container-title:Microelectronics Reliability
Author:
Rutkauskas M.,Farrell C.,Dorrer C.,Marshall K.L.,Crawford T.,Lundquist T.R.,Vedagarbha P.,Erington K.,Bodoh D.,Reid D.T.
Funder
Intelligence Advanced Research Projects Activity (IARPA) via Air Force Research Laboratory (AFRL)
Department of Energy National Nuclear Security Administration
University of Rochester
New York State Energy Research and Development Authority
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference20 articles.
1. IEEE International Reliability Physics Proceedings — 34th Annual;Nikawa,1996
2. ASM International Symposium for Testing and Failure Analysis — 27th Annual;Cole,2001
3. Soft defect localization (SDL) in ICs;Bruce,2002
4. IEEE International Reliability Physics Proceedings — 32nd Annual;Cole,1994
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