The core structure of extrinsic stacking faults in silicon
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.90103
Reference20 articles.
1. Surface Damage and Copper Precipitation in Silicon
2. Diffraction contrast analysis of two-dimensional defects present in silicon after annealing
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5. Growth of Lattice Defects in Silicon during Oxidation
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