Time-of-flight secondary ion mass spectrometry with transmission of energetic primary cluster ions through foil targets
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4869036
Reference20 articles.
1. Practical Surface Analysis;Briggs D.,1992
2. Prevention of electric breakdown during ion bombardment of organic insulators using a cluster ion beam
3. Comparison of secondary ion emission yields for poly-tyrosine between cluster and heavy ion impacts
4. Surface-sensitive Chemical Analysis of Organic Insulating Thin Films Using Negative Secondary Ions Induced by Medium Energy C$_{60}$ Impacts
5. TIARA electrostatic accelerators for multiple ion beam application
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1. Intense emission of surface-derived secondary ions from shallow-angle impacts of energetic MeV C60 ions;Applied Physics Express;2022-03-30
2. Secondary ion mass spectrometry using energetic cluster ion beams: Toward highly sensitive imaging mass spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-09
3. Experimental characterization of ultrafast phenomena of secondary-ion emission induced by nanoscale energy deposition processes of energetic C60 impacts;Journal of Applied Physics;2020-06-07
4. 0.12–0.54 MeV C60 ion impacts on a poly(methyl methacrylate) target: Characterization through emission properties of negative secondary ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-12
5. Experimental Study on the Biological Effect of Cluster Ion Beams in Bacillus subtilis Spores;Quantum Beam Science;2019-05-06
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