Secondary ion mass spectrometry using energetic cluster ion beams: Toward highly sensitive imaging mass spectrometry-Reference-Cited by-同舟云学术

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Secondary ion mass spectrometry using energetic cluster ion beams: Toward highly sensitive imaging mass spectrometry

Published:2020-09 Issue: Volume:479 Page:240-245
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Hirata K.,Yamada K.,Chiba A.,Hirano Y.,Saitoh Y.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference30 articles.

1. For example: Ion and Neutral Spectroscopy, Practical Surface Analysis Vol. 2, edited by D. Briggs and M.P. Seah (John Wiley & Sons, Chichester, 1992).

2. Cluster secondary ion mass spectrometry of polymers and related materials

3. Enhanced emission of secondary ions from solid surfaces bombarded with MeV polyatomic ions

4. Enhanced secondary-ion emission under gold-cluster bombardment with energies from keV to MeV per atom

5. Prevention of electric breakdown during ion bombardment of organic insulators using a cluster ion beam

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effects of Energetic Carbon-Cluster Ion Irradiation on Lattice Structures of EuBa2Cu3O7−x Oxide Superconductor;Quantum Beam Science;2022-05-25

2. Intense emission of surface-derived secondary ions from shallow-angle impacts of energetic MeV C₆₀ ions;Applied Physics Express;2022-03-30

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