Effect of structure and impurities on the epitaxial regrowth of amorphous silicon
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.91356
Reference7 articles.
1. Silicon epitaxy by solid‐phase crystallization of deposited amorphous films
2. Solid‐state epitaxial growth of deposited Si films
3. Evidence for void interconnection in evaporated amorphous silicon from epitaxial crystallization measurements
4. Optical Evidence for a Network of Cracklike Voids in Amorphous Germanium
5. Influence of16O,12C,14N, and noble gases on the crystallization of amorphous Si layers
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3. Oxygen contamination of low temperature ultrahigh vacuum‐deposited Ge films on GaAs;Applied Physics Letters;1996-07-22
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