Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3455219
Reference22 articles.
1. Atomic Force Microscope
2. Atomic resolution with an atomic force microscope using piezoresistive detection
3. Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer
4. Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor
5. High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
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