Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.365936
Reference9 articles.
1. Shallow ripples with giant wavelengths observed by atomic force microscopy: Real effects and the report of a new artifact
2. A nonoptical tip–sample distance control method for near‐field scanning optical microscopy using impedance changes in an electromechanical system
3. Piezoelectric tip‐sample distance control for near field optical microscopes
4. A phase-locked shear-force microscope for distance regulation in near-field optical microscopy
5. Shear force microscopy with capacitance detection for near‐field scanning optical microscopy
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