Author:
Krishnan Anand T.,Chakravarthi Srinivasan,Nicollian Paul,Reddy Vijay,Krishnan Srikanth
Subject
Physics and Astronomy (miscellaneous)
Reference14 articles.
1. V. Reddy, A. T. Krishnan, A. Marshall, J. Rodriguez, S. Natarajan, T. Rost, and S. Krishnan, in Proceedings of the International Reliab. Physics Symposium (IEEE, Piscataway, NJ, 2002), p. 248.
2. Negative bias temperature instability: Road to cross in deep submicron silicon semiconductor manufacturing
3. Negative bias stress of MOS devices at high electric fields and degradation of MNOS devices
4. Generalized diffusion-reaction model for the low-field charge-buildup instability at the Si-SiO2interface
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