Competing tunneling conduction mechanisms in oxygen deficient Hf0.5Zr0.5O2-Reference-Cited by-同舟云学术

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Competing tunneling conduction mechanisms in oxygen deficient Hf0.5Zr0.5O2

Published:2021-09-27 Issue:13 Volume:119 Page:132906
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

González Yoandris¹^ORCID,Hadj Youssef Azza¹^ORCID,Dörfler Andreas¹^ORCID,Katoch Rajesh¹^ORCID,El Mesoudy Abdelouadoud²³^ORCID,Sarkissian Andranik⁴^ORCID,Drouin Dominique²³^ORCID,Ruediger Andreas¹^ORCID

Affiliation:

1. Institut National de la recherche scientifique, Centre Énergie, Matériaux, Télécommunications, 1650 Boulevard Lionel-Boulet, Varennes, Québec J3X 1S2, Canada

2. Institut Interdisciplinaire d'Innovation Technologique (3IT), Universite de Sherbrooke, Sherbrooke, Quebec J1K 0A5 Canada

3. Laboratoire Nanotechnologies Nanosystemes (LN2), CNRS UMI-3463 3IT, Sherbrooke, Quebec J1K 0A5, Canada

4. Plasmionique Inc, 1650 Lionel-Boulet, Varennes, Québec J3X 1S2, Canada

Funder

Natural Sciences and Engineering Research Council of Canada

Canada Foundation for Innovation

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0064496

Reference27 articles.

1. Ferroelectric tunnel junctions for information storage and processing

2. Giant tunnel electroresistance for non-destructive readout of ferroelectric states

3. Tunneling Electroresistance Effect in Ferroelectric Tunnel Junctions at the Nanoscale

4. Ferroelectricity in hafnium oxide thin films

5. Ultrathin Hf0.5Zr0.5O2 Ferroelectric Films on Si

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Physics, Structures, and Applications of Fluorite‐Structured Ferroelectric Tunnel Junctions;Small;2023-10-20

2. Leakage mechanism in ferroelectric Hf0.5Zr0.5O2 epitaxial thin films;Applied Materials Today;2023-06

3. Mechanism of Oxygen Vacancy Filament-Based Resistive Switching in Non-polar Hf_0.5Zr_0.5O_2-δ Thin Films;ACS Applied Electronic Materials;2022-02-22

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