Microsecond carrier lifetimes in strained silicon‐germanium alloys grown by rapid thermal chemical vapor deposition
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.103991
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1. Si/Si/sub 1-x/Ge/sub x/ heterojunction bipolar transistors produced by limited reaction processing
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4. Silicon temperature measurement by infrared transmission for rapid thermal processing applications
5. Dominant Surface Electronic Properties of SiO2‐Passivated Ge Surfaces as a Function of Various Annealing Treatments
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