Depth profiling of nonuniform optical absorption in thin films: Application to hydrogenated amorphous silicon
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.349007
Reference35 articles.
1. Direct measurement of gap-state absorption in hydrogenated amorphous silicon by photothermal deflection spectroscopy
2. Optical absorption edge of hydrogenated amorphous silicon studied by photoacoustic spectroscopy
3. Thickness dependence of electrical and optical properties and E.S.R. in undoped a-Si: H
4. Optical absorption spectra of surface or interface states in hydrogenated amorphous silicon
5. Deposition‐induced defect profiles in amorphous hydrogenated silicon
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