Interferometric electropolisher for controlled surface removal
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1134430
Reference8 articles.
1. Simulation of high fluence fast neutron damage with heavy ion bombardment
2. Depth distribution of energy deposition by ion bombardment
3. Specimen preparation for transmission electron microscopy of heavy-ion-bombarded type 316 stainless steel
4. Removal of Thin (20 Å) Layers of Metals, Metal Oxides, and Ceramics by Mechanical Polishing
5. Use of vibratory polishing for the location of ion-bombardment induced voids in metal foils
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The Preparation of TEM Specimens from Hazardous or Difficult Materials;MRS Proceedings;1987
2. A review of the application of analytical electron microscopy to ion-implanted materials;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1986-06
3. Irradiation-altered precipitation in Fe-Ni-C alloys;Journal of Nuclear Materials;1985-08
4. Pulsed‐jet etch chamber for preparing silicon samples for transmission electron microscopy;Review of Scientific Instruments;1985-04
5. Effect of Ni+-ION bombardment on nickel and binary nickel alloys;Journal of Nuclear Materials;1981-03
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