Specimen preparation for transmission electron microscopy of heavy-ion-bombarded type 316 stainless steel-Reference-Cited by-同舟云学术

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Specimen preparation for transmission electron microscopy of heavy-ion-bombarded type 316 stainless steel

Published:1970-01 Issue:2 Volume:5 Page:281-283
ISSN:0033-7579
Container-title:Radiation Effects
language:en
Short-container-title:Radiation Effects

Author:

Brager H. R.¹,Kissinger H. E.¹,Kulcinski G. L.¹

Affiliation:

1. a Battelle Memorial Institute, Pacific Northwest Laboratory , Richland , Washington , U.S.A.

Publisher

Informa UK Limited

Subject

General Engineering

Link

https://www.tandfonline.com/doi/pdf/10.1080/00337577008235036

Reference3 articles.

1. The nature of faults formed in association with voids in AISI 316 stainless steel during 20 MeV C++ ion bombardment

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1. Controlled-Depth and cross-section preparation techniques for transmission electron microscopy subsurface studies in metals;Microscopy Research and Technique;1993-06-15

2. A method for evaluating radiation-induced grain boundary segregation using ion-irradiated microcrystalline stainless alloys;Journal of Nuclear Materials;1991-12

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