A review of the application of analytical electron microscopy to ion-implanted materials-Reference-Cited by-同舟云学术

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A review of the application of analytical electron microscopy to ion-implanted materials

Published:1986-06 Issue:2-3 Volume:16 Page:111-125
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Bentley J.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference76 articles.

1. Electron microscopy of thin crystals;Hirsch,1965

2. Introduction to analytical electron microscopy,1979

3. Practical analytical electron microscopy in materials science;Williams,1984

4. Characterization of displacement cascade damage in ordered alloys using transmission electron microscopy

5. Proc. Yamada Conf. V, Point Defects and Defect Interactions in Metals;Eyre,1982

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Atomic scale defect formation and phase transformation in Si implanted β-Ga2O3;APL Materials;2023-06-01

2. Microstructural evolution in Pt-implanted polycrystalline Al2O3;Acta Materialia;2015-01

3. Noble Gas Inclusions in Materials;Heterogeneous Chemistry Reviews;1996-09

4. Microstructure of ion irradiated ceramic insulators;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-06

5. Analytical electron microscopy of Al2O3 implanted with iron ions;Journal of Materials Science;1992

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