Design and assembly of the four-point probe system to estimate the physical quantities of Pt/FTO thin films
Author:
Publisher
AIP Publishing
Link
http://aip.scitation.org/doi/pdf/10.1063/5.0112525
Reference24 articles.
1. J. H. Kang, S. H. Lee, H. Ruh, and K. M. Yu, Development of a Thickness Meter for Conductive Thin Films Using Four-Point Probe Method, Journal of Electrical Engineering and Technology 1 (2021).
2. Extensions of four-point methods with arbitrarily located contacts for determination of physical quantities and sheet resistance imaging
3. Surface-sensitive conductance measurements
4. S. Choudhary, R. Narula, and S. Gangopadhyay, Thin Cu Film Resistivity Using Four Probe Techniques: Effect of Film Thickness and Geometrical Shapes, in AIP Conference Proceedings, Vol. 1953 (American Institute of Physics Inc., 2018), p. 100054.
5. Four-point probe electrical resistivity scanning system for large area conductivity and activation energy mapping
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