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Extensions of four-point methods with arbitrarily located contacts for determination of physical quantities and sheet resistance imaging

  • Published:2021-06 Issue: Volume:178 Page:109426
  • ISSN:0263-2241
  • Container-title:Measurement
  • language:en
  • Short-container-title:Measurement

Author:

Szymański Krzysztof R.,Kondratiuk Mirosław

Funder

Ministerstwo Edukacji i Nauki

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference20 articles.

1. Scanning microscopic four point conductivity probes;Petersen;Sens. Actuators, A,2002

2. Micro-four-point probe Hall effect measurement method;Petersen;J. Appl. Phys.,2008

3. Accurate microfour-point probe sheet resistance measurements on small samples;Thorsteinsson;Rev. Sci. Instrum.,2009

4. Microcantilever equipped with nanowire template electrodes for multiprobe, measurement on fragile nanostructures;Lin;J. Appl. Phys.,2004

5. Integrated nanoprobe for measuring microscopic electronic properties;Nagase;NTT Techn. Rev.,2006

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