Defects in semiconductors
Author:
Affiliation:
1. Department of Physics/Centre for Materials Science and Nanotechnology, University of Oslo, N-0316 Oslo, Norway
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
https://aip.scitation.org/doi/pdf/10.1063/5.0127714
Reference51 articles.
1. See http://www.icds31.org/ for the International Conference on Defects in Semiconductors.
2. Characterisation and Control of Defects in Semiconductors
3. Defects in Functional Materials
4. Acceptor-oxygen defects in silicon: The electronic properties of centers formed by boron, gallium, indium, and aluminum interactions with the oxygen dimer
5. Formation behavior of oxygen precipitates in silicon wafers subjected to ultra-high-temperature rapid thermal process
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