Evaluation of lattice curvature and crystalline homogeneity for 2-inch GaN homo-epitaxial layer-Reference-Cited by-同舟云学术

Evaluation of lattice curvature and crystalline homogeneity for 2-inch GaN homo-epitaxial layer

Published:2018-07 Issue:7 Volume:8 Page:075318
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Seo Okkyun¹²³,Kim Jae Myung¹²,Song Chulho²,Lou Yanfang¹²,Kumara L. S. R.³^ORCID,Hiroi Satoshi³^ORCID,Chen Yanna²³,Katsuya Yoshio²,Irokawa Yoshihiro¹,Nabatame Toshihide¹,Koide Yasuo¹^ORCID,Sakata Osami¹²³^ORCID

Affiliation:

1. Center for GaN Characterization and Analysis, Synchrotron X-Ray Characterization Group, Research Network and Facility Services Division, National Institute for Materials Science (NIMS), Kouto, Sayo, Hyogo 679-5148, Japan

2. Synchrotron X-Ray Station at Spring-8, Research Network and Facility Services Division, NIMS, Kouto, Sayo, Hyogo 679-5148, Japan

3. Synchrotron X-Ray Group, Research Center for Advanced Measurement and Characterization, NIMS, Kouto, Sayo, Hyogo 679-5148, Japan

Funder

National Institutes of Natural Sciences

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5042098

Reference38 articles.

1. The Blue Laser Diode