Study of fluorine behavior in silicon by selective point defect injection

Author:

Kham M. N.,El Mubarek H. A. W.,Bonar J. M.,Ashburn P.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Effect of fluorine on the suppression of boron diffusion in pre-amorphized silicon;Journal of Applied Physics;2020-09-14

2. Diffusion modelling of low-energy ion-implanted BF2 in crystalline silicon: Study of fluorine vacancy effect on boron diffusion;Materials Science and Engineering: B;2008-12

3. Evolution of fluorine and boron profiles during annealing in crystalline Si;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;2008

4. Reduced boron diffusion under interstitial injection in fluorine implanted silicon;Journal of Applied Physics;2007-12

5. Effect of fluorine on boron diffusion under interstitial injection from the surface;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-12

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