Ar+ bombardment of Si(100) in oxygen atmosphere: Room temperature oxide formation studied by x‐ray photoelectron spectroscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.359896
Reference5 articles.
1. Chemical and electronic structure of the SiO2/Si interface
2. A new ESCA instrument with improved surface sensitivity, fast imaging properties and excellent energy resolution
3. Microscopic structure of theSiO2/Si interface
4. Initial stage of thermal oxidation of the Si(111)-(7×7) surface
5. XPS study on the early stages of oxidation of Si(100) by atomic oxygen
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Quantitative Determination of Ligand Densities on Nanomaterials by X-ray Photoelectron Spectroscopy;ACS Applied Materials & Interfaces;2015-01-15
2. Light absorption in silicon quantum dots embedded in silica;Journal of Applied Physics;2009-11-15
3. Improvement of high aspect ratio Si etching by optimized oxygen plasma irradiation inserted DRIE;Journal of Micromechanics and Microengineering;2009-09-01
4. Depth profiles and concentration percentages of SiO2 and SiO x induced by ion bombardment of a silicon (100) target;Journal of Materials Science: Materials in Electronics;2008-04-25
5. Distinct processes in radio-frequency reactive magnetron plasma sputter deposition of silicon suboxide films;Journal of Applied Physics;2007-12-15
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3