Determination of the energy-dependent conduction band mass in SiO2
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.124709
Reference27 articles.
1. Understanding hot‐electron transport in silicon devices: Is there a shortcut?
2. Theory of high-field electron transport in silicon dioxide
3. Anode hole injection and trapping in silicon dioxide
4. Characterization of the hot-electron-induced degradation in thin SiO2 gate oxides
5. Tunneling in thin MOS structures
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