Spectroscopic ellipsometry study of a self-organized Ge dot layer
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1592882
Reference25 articles.
1. Independent determination of Ge content in thin Si1−xGex quantum wells by spectroscopic ellipsometry
2. Optical spectra of SixGe1−xalloys
3. Spectroscopic ellipsometry characterization of strained and relaxed Si1−xGexepitaxial layers
4. Spectroscopic ellipsometry ofE1-like transitions in nanometer-thickness Ge layers
5. Analysis and characterization of native oxide growth on epitaxial Si1−xGex films after a chemical clean
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Optical properties of Bi2Se3: from bulk to ultrathin films;Journal of Physics D: Applied Physics;2016-11-11
2. Room temperature Ultraviolet B emission from InAlGaN films synthesized by plasma-assisted molecular beam epitaxy;Applied Physics Letters;2015-09-28
3. Ellipsometry studies of Si/Ge superlattices with embedded Ge dots;Applied Physics A;2013-05-31
4. Ellipsometry and spectroscopy on 1.55μm emitting Ge islands in Si for photonic applications;Physical Review B;2012-09-13
5. Ellipsometric study of thermally induced redistribution and crystallization of Ge in Ge:SiO2 mixture layers;Thin Solid Films;2011-06
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3