Electron spin resonance features of interface defects in thermal (100)Si/SiO2
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.367005
Reference32 articles.
1. Characterization of Si/SiO2 interface defects by electron spin resonance
2. The silicon-silicon dioxide system: Its microstructure and imperfections
3. Interface states and electron spin resonance centers in thermally oxidized (111) and (100) silicon wafers
4. 29Si hyperfine structure of unpaired spins at the Si/SiO2interface
5. Dipolar interaction between [111]Pbdefects at the (111)Si/SiO2interface revealed by electron-spin resonance
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