Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications-Reference-Cited by-同舟云学术

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Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications

Published:2015-12 Issue:12 Volume:86 Page:123703
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Morawski Ireneusz^ORCID,Spiegelberg Richard,Korte Stefan,Voigtländer Bert

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4936975

Reference39 articles.

1. Electrical Resistance of a Monatomic Step on a Crystal Surface

2. Microscopic four-point-probe resistivity measurements of shallow, high density doping layers in silicon

3. Nanoscale Carrier Multiplication Mapping in a Si Diode

4. Nanopotentiometry: Local potential measurements in complementary metal–oxide–semiconductor transistors using atomic force microscopy

5. Exceptional ballistic transport in epitaxial graphene nanoribbons

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1. Three-Dimensional Nano Measurement System Based on Resonant Trigger Probe;IEEE Transactions on Instrumentation and Measurement;2024

2. Atomic structure and electron distribution of Co atoms adsorbed on Si(111) surface by NC-AFM/KPFM at 78 K;Surface Science;2022-10

3. Large-scale and high-depth three dimensional scanning measurement system and algorithm optimization;Review of Scientific Instruments;2022-05-01

4. Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis;Review of Scientific Instruments;2018-10

5. Sensing Performance Analysis on Quartz Tuning Fork-Probe at the High Order Vibration Mode for Multi-Frequency Scanning Probe Microscopy;Sensors;2018-01-24

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