Raman study under resonant conditions of defects near the interface in a GaAs/Si heterostructure
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.346133
Reference17 articles.
1. Raman study of an epitaxial GaAs layer on a Si [100] substrate
2. Optical determination of strains in heterostructures: GaAs/Si as an example
3. Heterogeneous Strain Relaxation in GaAs on Si (100)
4. Si‐substrate preparation for GaAs/Si molecular‐beam epitaxy at low temperature under a Si flux
5. Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV
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