Single shot measurement of the lifetime of a trapped electron in the gate dielectric of a high-k field effect transistor
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3013576
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1. Electron spin–lattice and spin–spin relaxation study of a trinuclear iron(iii) complex and its relevance in quantum computing
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