Scanning Electron Microscope as a Means of Studying Microplasmas at High Resolution
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1708587
Reference11 articles.
1. Model for the Electrical Behavior of a Microplasma
2. Problems related to p-n junctions in silicon
3. Visible Light Emission and Microplasma Phenomena in Silicon p-n Junction II. Classification of weak spots in diffused p-n junctions
4. Avalanche Effects in Silicon p—n Junctions. I. Localized Photomultiplication Studies on Microplasmas
5. Avalanche Breakdown in Gallium Arsenidep−nJunctions
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1. Strategy: Fitting the Technique to the Problem;Studies in Analytical Chemistry;1988
2. Defect microstructure and microplasmas in silicon avalanche photodiodes;Journal of Materials Science;1987-10
3. Failure mode analysis of planar zinc‐diffused In0.53Ga0.47Asp‐i‐nphotodiodes;Journal of Applied Physics;1984-03-15
4. Charge collection scanning electron microscopy;Journal of Applied Physics;1982-06
5. Observation of p-n Junctions with a Flying-Spot Scanner Using a Chopped Photon Beam;Japanese Journal of Applied Physics;1982-04-20
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