Defect microstructure and microplasmas in silicon avalanche photodiodes-Reference-Cited by-同舟云学术

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Defect microstructure and microplasmas in silicon avalanche photodiodes

Published:1987-10 Issue:10 Volume:22 Page:3547-3555
ISSN:0022-2461
Container-title:Journal of Materials Science
language:en
Short-container-title:J Mater Sci

Author:

Lesniak M.,Holt D. B.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF01161457.pdf

Reference37 articles.

1. L. J. M. Bollen, J. J. Goedbloed andE. T. J. M. Smeets,Philips Tech. Rev. 36 (1976) 205.

2. L. J. Mayes,Electro-optic System Design (December 1982) p. 28.

3. K. G. McKay,Phys. Rev. 94 (1954) 877.

4. H. Kressel,RCA Rev. 28 (1967) 175.

5. D. J. Rose,Phys. Rev. 105 (1957) 413.

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4. Resonant-cavity-enhanced single photon avalanche diodes on double silicon-on-insulator substrates;Journal of Modern Optics;2009-01-20

5. Reliability of InGaAsInP based separate absorption grading multiplication avalanche photodiodes;Microelectronics Reliability;1996-07

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