Nondestructive technique to measure bulk lifetime and surface recombination velocities at the two surfaces by infrared absorption due to pulsed optical excitation
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.352174
Reference9 articles.
1. Measurement of Free‐Carrier Lifetimes in GaP by Photoinduced Modulation of Infrared Absorption
2. Lifetime measurement in Hg0.7Cd0.3Te by population modulation
3. Contactless measurement of bulk free‐carrier lifetime in cast polycrystalline silicon ingots
4. Lifetime measurements in semiconductors by infrared absorption due to pulsed optical excitation
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