Photoelectron study of the valence levels of CF4 and SiF4 from 20 to 100 eV
Author:
Publisher
AIP Publishing
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.449749
Reference47 articles.
1. Calculated photoionization cross sections for SF6
2. Photoelectron branching ratios and angular distributions for the valence levels of SF6in the range16≤hν≤30eV
3. Angle‐resolved photoelectron spectroscopy of CCl4: The Cooper minimum in molecules
4. Angle-resolved photoelectron study of the valence levels ofBF3in the range17≤hν≤28eV
5. Angle‐resolved photoelectron cross section of CF4
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