High Resolution Core- and Valence-Level XPS Studies of the Properties (Structural, Chemical and Bonding) of Silicate Minerals and Glasses-Reference-Cited by-同舟云学术

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High Resolution Core- and Valence-Level XPS Studies of the Properties (Structural, Chemical and Bonding) of Silicate Minerals and Glasses

Published:2014-01-01 Issue:1 Volume:78 Page:271-329
ISSN:1529-6466
Container-title:Reviews in Mineralogy and Geochemistry
language:en
Short-container-title:Reviews in Mineralogy and Geochemistry

Author:

Nesbitt H. W.,Bancroft G. M.

Publisher

Mineralogical Society of America

Subject

Geochemistry and Petrology

Cited by 44 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Valence band XPS spectra of K silicate glasses: Effect of HOMO energies on K, Na and Li leach rates, activation energies and reaction mechanism;Journal of Non-Crystalline Solids;2024-08

2. Current problems in the field of structure, properties of minerals and methods of their investigation;LITHOSPHERE (Russia);2024-05-03

3. Valence Band Xps Spectra of K Silicate Glasses: Effect of Homo Energies on K, Na and Li Leach Rates, Activation Energies and Reaction Mechanism;2024

4. New assignments of Raman spectra of tetrahedra and the effects of electronegativity. I. P4O10 and Si-containing molecules;AIP Advances;2023-12-01

5. Insights on surface analysis techniques to study glass primary packaging;International Journal of Applied Glass Science;2023-03-09

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