Experimental scaling of plane-Born cross sections and ab initio assignments for electron-impact excitation and dissociation of XF4 (X = C, Si, and Ge) molecules-Reference-Cited by-同舟云学术

Experimental scaling of plane-Born cross sections and ab initio assignments for electron-impact excitation and dissociation of XF4 (X = C, Si, and Ge) molecules

Published:2017-04-11 Issue:14 Volume:146 Page:144306
ISSN:0021-9606
Container-title:The Journal of Chemical Physics
language:en
Short-container-title:J. Chem. Phys.

Author:

Hoshino M.¹,Duflot D.²³^ORCID,Limão-Vieira P.¹⁴,Ohtomi S.¹,Tanaka H.¹

Affiliation:

1. Department of Physics, Sophia University, Tokyo 102-8554, Japan

2. UMR 8523 - Physique des Lasers Atomes et Molécules, Université de Lille, F-59000 Lille, France

3. CNRS, UMR 8523, F-59000 Lille, France

4. Laboratório de Colisões Atómicas e Moleculares, CEFITEC, Departamento de Física, Faculdade de Ciências e Tecnologia, Universidade NOVA de Lisboa, 2829-516 Caparica, Portugal

Funder

European Fund for Regional Economic Development

French National Reserch Agency

GENCI-TGCC

Portuguese National Funding Agency FCT-MCTES

Region Haunts de France and the Ministere de I'Enseignement Superieur et de la Recherche (CPER Climibio)

The Centre de Ressources Informatiques of the Universite of Lille

Ministry of Education, Culture, Sports, Science and Technology (MEXT)

Japan Society for the Promotion of Science (JSPS)

Publisher

AIP Publishing

Subject