Traps in molecular‐beam epitaxial In0.53(GaxAl1−x)0.47As/InP
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.345492
Reference7 articles.
1. LPE and VPE In<inf>1-x</inf>Ga<inf>x</inf>As<inf>y</inf>P<inf>1-y</inf>/InP: Transport properties, defects, and device considerations
2. Compositional dependence of band‐gap energy and conduction‐band effective mass of In1−x−yGaxAlyAs lattice matched to InP
3. Preparation and properties of molecular beam epitaxy grown (Al0.5Ga0.5)0.48In0.52As
4. Deep levels and a possible d-x-like center in molecular beam epitaxial inxal1−xas
5. Trapping characteristics and a donor-complex (DX) model for the persistent-photoconductivity trapping center in Te-dopedAlxGa1−xAs
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1. Impact of band to band tunneling in In0.53Ga0.47As tunnel diodes on the deep level transient spectra;Applied Physics Letters;2018-12-03
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3. Degradation Mechanisms of Heterogeneous III-V/Silicon 1.55- $\mu \text{m}$ DBR Laser Diodes;IEEE Journal of Quantum Electronics;2017-08
4. Trapping-charging ability and electrical properties study of amorphous insulator by dielectric spectroscopy;Journal of Applied Physics;2014-09-14
5. Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation;Materials and Reliability Handbook for Semiconductor Optical and Electron Devices;2012-08-23
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