Trapping-charging ability and electrical properties study of amorphous insulator by dielectric spectroscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4895124
Reference38 articles.
1. Investigation of oxide charge trapping and detrapping in a MOSFET by using a GIDL current technique
2. Effects of detrapping on electron traps generated in gate oxides
3. Effect of Electrons Trapping/De-Trapping at Si-SiO2Interface on Two-State Current in MOS(p) Structure with Ultra-Thin SiO2by Anodization
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