Charge trapping at the low-k dielectric-silicon interface probed by the conductance and capacitance techniques
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2990648
Reference26 articles.
1. Effect of Porosity on Electrical Stability of Hydrocarbon Polymeric Low-$k$Dielectric
2. Investigation of electrical conduction in carbon-doped silicon oxide using a voltage ramp method
3. Proceedings of the IEEE International Reliability Physics Symposium;Chen F.,2006
4. Moisture Influence on Porous Low-$k$Reliability
5. Internal photoemission of electrons at interfaces of metals with low-κ insulators
Cited by 41 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Charge Transport Mechanism in a PECVD Deposited Low-k SiOCH Dielectric;Journal of Electronic Materials;2022-03-06
2. Charge Transport Mechanism and Trap Origin in Methyl‐Terminated Organosilicate Glass Low‐κ Dielectrics;physica status solidi (a);2020-12-21
3. A detailed ellipsometric porosimetry and positron annihilation spectroscopy study of porous organosilicate-glass films with various ratios of methyl terminal and ethylene bridging groups;Microporous and Mesoporous Materials;2020-10
4. Optically enhanced trap assisted hysteretic I-V characteristics of nanocrystalline silicon based p-i-n heterostructure;Journal of Applied Physics;2020-02-24
5. Surface Ge-rich p-type SiGe channel tunnel field-effect transistor fabricated by local condensation technique;Solid-State Electronics;2020-02
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3