Calculating Kelvin force microscopy signals from static force fields
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3323098
Reference15 articles.
1. Kelvin probe force microscopy
2. Silicon pn junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopy
3. Compensating electrostatic forces by single-scan Kelvin probe force microscopy
4. Resolution and contrast in Kelvin probe force microscopy
5. Real versus Measured Surface Potentials in Scanning Kelvin Probe Microscopy
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