Real versus Measured Surface Potentials in Scanning Kelvin Probe Microscopy
Author:
Affiliation:
1. Applied Physics, Eindhoven University of Technology, P.O. Box 513, 5600 MB, Eindhoven, The Netherlands,
2. COBRA Research Institute, Eindhoven University of Technology, P.O. Box 513, 5600 MB, Eindhoven, The Netherlands
Publisher
American Chemical Society (ACS)
Subject
General Physics and Astronomy,General Engineering,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/nn700190t
Reference32 articles.
1. Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy
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