Resolution and contrast in Kelvin probe force microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.368181
Reference14 articles.
1. Scanning tunneling potentiometry
2. Scanning tunneling microscopy and potentiometry on a semiconductor heterojunction
3. High‐resolution capacitance measurement and potentiometry by force microscopy
4. High resolution atomic force microscopy potentiometry
5. Kelvin probe force microscopy
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