Device for the determination of spring constants of atomic force microscope cantilevers and micromachined springs
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1471351
Reference5 articles.
1. A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy
2. Calibration of atomic‐force microscope tips
3. Method for the calibration of atomic force microscope cantilevers
4. Short cantilevers for atomic force microscopy
5. Simulation, dynamic testing and design of micromachined flexible joints
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