Subject
General Physics and Astronomy
Reference29 articles.
1. J. McPherson and
D. Baglee , International Reliability Physics Proceedings (
IEEE,
Piscataway, NJ, 1985), p. 1.
2. I. Chen ,
S. Holland , and
C. Hu , International Reliability Physics Proceedings (
IEEE,
Piscataway, NJ, 1985), p. 24.
3. Underlying physics of the thermochemical E model in describing low-field time-dependent dielectric breakdown in SiO2 thin films
4. Thermochemical description of dielectric breakdown in high dielectric constant materials
5. Ultrathin gate oxide reliability: physical models, statistics, and characterization
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