Residual strain dependence of optical characteristics in GaN layers grown on (0001) sapphire substrates
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.124621
Reference14 articles.
1. Candela‐class high‐brightness InGaN/AlGaN double‐heterostructure blue‐light‐emitting diodes
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3. Study of cracking mechanism in GaN/α‐Al2O3structure
4. Crystallography of epitaxial growth of wurtzite‐type thin films on sapphire substrates
5. Relaxation Mechanism of Thermal Stresses in the Heterostructure of GaN Grown on Sapphire by Vapor Phase Epitaxy
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