Investigation of the direct band gaps in Ge1−xSnx alloys with strain control by photoreflectance spectroscopy

Author:

Lin Hai,Chen Robert,Lu Weisheng,Huo Yijie,Kamins Theodore I.,Harris James S.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Cited by 109 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Molecular Beam Epitaxy of Si, Ge, and Sn and Their Compounds;Thin Films - Growth, Characterization and Electrochemical Applications;2024-01-17

2. Band-gap and strain engineering in GeSn alloys using post-growth pulsed laser melting;Journal of Physics: Condensed Matter;2022-12-14

3. Design of Mid-Infrared Ge1–x Snx Homojunction p-i-n Photodiodes on Si Substrate;IEEE Sensors Journal;2022-04-15

4. Achievable Performance of Uncooled Homojunction GeSn Mid-Infrared Photodetectors;IEEE Journal of Selected Topics in Quantum Electronics;2022-03

5. Raman scattering study of GeSn under 〈1 0 0〉 and 〈1 1 0〉 uniaxial stress;Nanotechnology;2021-06-09

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